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Improved probe quality aesthetics
for soft copper
-- Slotted for easy assembly
Multi Specimen Holder for JEOL Stubs
Roughness: Typically 2-3Å
HS-500MG Mount:Mounted Improved probe quality aestheticsHeight Calibration Standard, 500 nm DESCRIPTION Height Calibration Standard, 500 nm The problem: Atomic Force Microscopy has become a valuable tool not only for visualization but also for performing accurate measurements on the nanometer and micrometer scale. In order to make the most of their measurement capabilities, AFM systems need to be properly calibrated. The solution: HS 500MG is one of the height standards introduced by BudgetSensors as a
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