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useful for EDX analysis
Recommended for use with Bruker Dimension FastScan AFM
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESPA-V2
PtIr Conductive Coating
pitch size is selectable from 2µm to 15µm
Test Grating for Tip Sharpness Hysitron useful for EDX analysisDESCRIPTION The TGTZ 400 test grating is intended for 3 D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control. Structure: Si wafer with grating in top surface Pattern type: Array of sharp tips Tip angle: About 50 degrees Tip Radius: 10nm Tip Height: 0. 3 0. 7m Period: 3 0. 01m Diagonal period: 2. 12m Chip size: 5 x 5 x 0. 5mm Effective area: Central square of 2 x 2mm
