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Tipless silicon nitride cantilever for tip customization or functionalization such as molecule or particle tips
Tip Geometry: Standard Tip Height: 10 - 15 Front Angle: 25+/-2 Back Angle: 15+/-2 Side Angle: 17
measuring report (Symetrics)
145nm AFM Reference Standard
A pack of Silicon Probes
StrataTek™ Hexagonal Grids Silicon Nitride Tipless silicon nitride cantilever forDESCRIPTION SIZE SPECIFICATIONS The StrataTek TEM grids for Transmission Electron Microscopy have a thickness of 25m and are manufactured using a micron precision etching process of thin foils. This method produces sturdy and rigid TEM grids. Both sides have the same surface characterization. StrataTek grids have a slightly higher density than grids made by electroplating. Corners where bars meet tend to be rounded. Available in coarser mesh sizes
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