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and other electrical characterization applications
5 Tip Radius (Nom): 5 Tip Radius (Max): 8 Tip Set Back (Nom): 1
Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features
Optimized for PeakForce Tapping operation in air and fluid at high scan speeds
Other applications of the DDESP-FM-V2 probe include: Scanning Capacitance Microscopy (SCM)
AD-2.8-AS 22 kHz and other electrical characterization applicationsSharp Conductive Single Crystal Diamond Probes, 2. 8 N m, 65 kHz, 10 nm ROC, 5 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Sharp Conductive Single Crystal Diamond Probes, 2. 8 N m, 65 kHz, 10 nm ROC, 5 Pack Intermediate spring constant for applications including: Topography imaging in PeakForce Tapping, Tappingmode, and contact mode. Nanomechanics with PeakForce QNM, FASTForce Volume, contact resonance, nanoindentation. Highly
