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4mm (1") square sample surface and a standard 3
Offered with three sizes of openings: 0
250 and 100 nm) — ✓ NIST traceable ✓ ✓ Certification available ✓ ✓ Unmounted ✓ ✓ Mounts A-R available ✓ ✓ Precision better than 0
PELCO Low Profile SEMClip™ Specimen Mounts
Tin on Carbon
ContGB-G Hitachi 4mm (1") square sample surfaceGold Coated Contact Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Contact Mode AFM Probe Monolithic silicon AFM probe for contact mode and lateral force mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Not
