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55 Cantilever Geometry: Rectangular Cantilevers Number: 1
Highly wear resistant
Highly sensitive nanoelectrical measurements
VITA nTA Calibration Sample Set DESCRIPTION
These SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes
FIB6-400A 110 kHz 55 Cantilever Geometry: Rectangular Cantilevers42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m, Al reflective coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m, Al reflective coating High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 15: 1 at 6um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 1. 7 Back Angle: 11 31 Side Angle: 1. 7 Tip Radius (Nom): 10
