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Center-Marked Grids
"Direct nanofabrication and transmission electron microscopy on a suite of easy-to-prepare ultrathin film substrates"
flakes ensure maximum conductivity
Sturdy but soft and non-scratching
the supplied sample modulus is nominal andmay change with sample aging
PPP-CONTAu-10 119 Center-Marked GridsDESCRIPTION POINTPROBE PLUS Silicon SPM Probe, silicon cantilever for contact mode, detector and tip side: Au coating
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