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5+/-5 Tip Radius (Nom): 40 Tip Set Back( RNG): 15-25 Tilt Compensation: 7 +/- 1
Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices
5 Cantilever Geometry: Rectangular Back Side Coating: Reflective Aluminum
2 nm respectively
the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants
AD-40-P40 Automated AFM 5+/-5 Tip Radius (Nom): 40DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS High aspect ratio probe for small scale structures. This model offers 100nm tall cylindrical shaped pillar tips with 40nm base diameter, combined with a high 40N m spring constant. As with all Adama probes, these are formed out of single crystal boron doped diamond and are wear resistant and conductive. Suitable for electrical characterization with PeakForce TUNA, TUNA, and CAFM. Tip Geometry:
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