Pelcotec™ CDMS-1C Select:Mount O uncoated sample surfaces of conductive

uncoated sample surfaces of conductive materials in the SEM

The low nominal 0

01844G - Carbon Film only on 400 mesh

Other applications are conductive paths for electronic components and EMI/RFI shielding

Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features

Pelcotec™ CDMS-1C Select:Mount O uncoated sample surfaces of conductiveDESCRIPTION PRODUCT SPECIFICATIONS Certified against NIST standard with features from 2mm to 1m for magnification 10 20,000x (ideal for desktop SEM) Feature sizes: 2mm, 1mm, 0. 5mm, 10m, 5m, 2m, and 1m See mount selections, types A R Pelcotec CDMS Critical Dimension Magnification Standard Easy to use and very useful for quick and precise SEM, FESEM, FIB, CD SEM, LM, and AFM magnification calibration. Unique, economically priced, yet fully featured and