Tipcheck AFM Tip Characterizer PELCO® Grids Cantilever & wafer tool kit:

Cantilever & wafer tool kit: 1 scribe

acid resistant

"Three-dimensional architecture of inorganic nanoarrays electrodeposited though a surface-layer protein mask"

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2

This holder supports Electrostatic Force Microscopy (EFM)

Tipcheck AFM Tip Characterizer PELCO® Grids Cantilever & wafer tool kit:Sample for Analyzing AFM Tip Geometry DESCRIPTION Sample for Analyzing AFM Tip Geometry The problem: Blunt or broken tips falsify measurement results like surface roughness or structures dimensions dramatically! To ensure correct results, used tips must be thrown away or checked by SEM regularly, both methods being extremely uneconomic or time consuming. The solution: The TipCheck is an SPM sample for fast and convenient determination of the AFM tip