FIB8-600A Bruker High aspect ratio probe for

High aspect ratio probe for repeatable

ScanAsyst-Air-HPI Super Sharp Probes

and Caliber SPMs

such as a piece of semiconductor material

The MSCT cantilever layout consists of an "A"cantilevers on one side of the probe

FIB8-600A Bruker High aspect ratio probe for42N m, 320kHz, 10nm Tip Radius, 600nm Wide Spike @ 8m, Al reflective coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 600nm Wide Spike @ 8m, Al reflective coating High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 12: 1 at 8um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 2 0. 5 Back Angle: 2 0. 5 Side Angle: 2 0. 5 Tip Radius