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Ships within 48 hours · Estimated delivery Aug 6 - Aug 11
6mm diameter DESCRIPTION
These SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes
this cantilever holder is useful for sensitive Magnetic Force Microscopy (MFM) imaging
and 60mm Petri dishes
The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2
SSRM-SMPL-OX 280 kHz 6mm diameter DESCRIPTIONDESCRIPTION Unmounted Oxide sample. PLEASE NOTE: Sample cross sectioning by cleaving or polishing is required. Resolution Qualification Structure RQ04 The imec CAMS resolution qualification structures consist of a thin uniform layer of SiO2 confined between highly doped grown poly Si and implanted Si. The RQ04 standard has an average thickness of 0. 40. 1nm and is ideally suited to determine the resolution of electrical probes or for imaging
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