SCM-PIT-V2 8 N/m Tip Geometry: Solid Wire Tip

Tip Geometry: Solid Wire Tip Height: ~100 Tip Radius (Nom): <20

All cantilevers have less than +/- 2 deg bend

5º Back Angle: 1 - 14 Side Angle: 22

5 Tip Radius (Nom): 1 Tip Radius (Max): 2 Tip Set Back (Nom): 1

025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom): 5

SCM-PIT-V2 8 N/m Tip Geometry: Solid Wire TipConductive Probes, 3N m, 75kHz, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker's new SCM PIT V2 probe replaces the legacy SCM PIT probe. Built on the high performance RFESP 75 AFM probe, Bruker's SCM PIT V2 probe has a Platinum Iridium coated,electrically conductive tip that is ideal for Electrical ForceMicroscopy (EFM), Kelvin Probe Force Microscopy (KPFM), ScanningCapacitance Microscopy (SCM), and other electrical